发明名称 |
GERMANIUM FINFET WITH METAL GATE AND STRESSOR |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a germanium FinFET with metal gates and stressors. <P>SOLUTION: An integrated circuit structure includes: an n-type fin field effect transistor (FinFET) and a p-type FinFET. The n-type FinFET includes a first germanium fin over a substrate; a first gate dielectric on a top surface and sidewalls of the first germanium fin; and a first gate electrode on the first gate dielectric. The p-type FinFET includes: a second germanium fin over the substrate; a second gate dielectric on a top surface and sidewalls of the second germanium fin; and a second gate electrode on the second gate dielectric. The first gate electrode and the second gate electrode are formed of a same material having a work function close to an intrinsic energy level of germanium. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011071517(A) |
申请公布日期 |
2011.04.07 |
申请号 |
JP20100211635 |
申请日期 |
2010.09.22 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD |
发明人 |
YEH CHIH-CHIEH;CHANG CHIH-SHENG;WANN HSINGJEN |
分类号 |
H01L21/8238;H01L27/092;H01L29/78 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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