<p>A contacting or non-contacting probe (2) is mounted to a spindle (6), preferably a tool spindle, of a machining device, such as a chamfering device (4), whereby it has a home position retracted out of the way of the machining (e.g. chamfering) process and an active position where it can contact a workpiece before or after the machining (e.g. chamfering) process.</p>
申请公布号
WO2011041477(A1)
申请公布日期
2011.04.07
申请号
WO2010US50809
申请日期
2010.09.30
申请人
THE GLEASON WORKS;GLASOW, KENNETH, E.;MCGLASSON, WILLIAM, D.