发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To enhance the quality of a film by suppressing the incorporation of impurities into the thin film. SOLUTION: A method for manufacturing a semiconductor device includes the steps of: supplying a halogen-containing gas into a treatment chamber for treating a substrate therein; supplying a source gas which is different from the halogen-containing gas into the treatment chamber; producing active species of the source gas in the vicinity of the substrate by supplying an electron-beam into the treatment chamber; forming a thin film on the substrate by making the active species of the source gas react with the halogen-containing gas; supplying a hydrogen-containing gas into the treatment chamber; producing active species of the hydrogen-containing gas in the vicinity of the substrate by supplying an electron-beam into the treatment chamber; and reforming the thin film which has been formed on the substrate by making the active species of the hydrogen-containing gas react with halogen elements in the thin film which has been formed on the substrate. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011068974(A) 申请公布日期 2011.04.07
申请号 JP20090222920 申请日期 2009.09.28
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 HIRAMATSU HIROO;YAMAGUCHI TENWA;SHIRAKO KENJI
分类号 C23C16/44;C23C16/56;H01L21/205;H01L21/28;H01L21/285;H01L21/31 主分类号 C23C16/44
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