发明名称 |
VERTICAL NAND CHARGE TRAP FLASH MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME |
摘要 |
<p>PURPOSE: A vertical NAND charge trap flash memory device and a manufacturing method thereof are provided to highly integrate a memory device by vertically connecting cell transistors with a charge trap layer in series. CONSTITUTION: A single crystal semiconductor channel(150) is vertically formed on a semiconductor substrate(100). A GSL(Ground Source Line) electrode(115) is adjacent to the semiconductor substrate and surrounds a signal crystal semiconductor channel. A tunnel oxide layer(145) surrounds the channel side of a single crystal semiconductor filler shape. First to n+1 interlayer insulation layers(120a,120b,120c,120d,120e) are formed on the GSL electrode. A charge trap layer(170) is formed between the first to n+1 interlayer insulation layers.</p> |
申请公布号 |
KR20110034816(A) |
申请公布日期 |
2011.04.06 |
申请号 |
KR20090092258 |
申请日期 |
2009.09.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, YOUNG HOO;LEE, HYO SAN;BAE, SANG WON;YOON, BO UN;LEE, KUN TACK |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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