| 摘要 |
PURPOSE: A test circuit, a semiconductor memory apparatus using the same, and a test method of the semiconductor memory apparatus are provided to increase the reliability of an USD test by applying the same condition to all activated mat. CONSTITUTION: In a test circuit, a semiconductor memory apparatus using the same, and a test method of the semiconductor memory apparatus, an active signal is enabled. Test control signal generating parts(100,200) enable a control signal. The test control signal generating part maintains an enabled control signal. A reserved bit line precharge signal is disabled. Precharge controllers(300~600) turns reversely the control signal. The precharge controller outputs the reserved control signal as the bit line precharge signal.
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