SEMICONDUCTOR MEMORY APPARATUS AND TEST METHOD USING THE SAME

摘要

PURPOSE: A semiconductor memory apparatus and a test method using the same are provided to increase an USD test time regardless of the leakage current of a transistor. CONSTITUTION: In a semiconductor memory apparatus and a test method using the same, a precharge voltage controller(100) outputs a bit line prechrage voltage or a core voltage as a control voltage. A bit line equalizer(30-1) precharges a bit line by a control voltage. A sense amp drive controller(200) generates a first, a second, and a third voltage supply control signal. A power supply unit(50-1) supplies an external voltage, a core voltage, and a ground voltage.