发明名称 Non volatile memory circuit with tailored reliability
摘要 A non-volatile memory (NVM) circuit is provided, that includes at least a first and second NVM sub-array. The first sub-array is built from first memory cells. The second NVM sub-array is built from second memory cells that are constructed differently from the first memory cells. The NVM sub-arrays share a support circuit. In some embodiments the sub-arrays can be constructed, so that they exhibit different characteristics tailored to their intended use. For example one sub-array might be tailored for data retention, while the next sub-array for programming endurance, still another for write disturb immunity.
申请公布号 US7920423(B1) 申请公布日期 2011.04.05
申请号 US20080114574 申请日期 2008.05.02
申请人 SYNOPSYS, INC. 发明人 MA YANJUN;MOZSGAI STEVEN I.
分类号 G11C16/04 主分类号 G11C16/04
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