发明名称 DUAL-PORE STRUCTURE POLISHING PAD
摘要 PURPOSE: A polishing pad of a dual-void structure is provided to reduce defects caused by pads and increase polishing speed. CONSTITUTION: A polishing pad of a dual-void structure comprises a porous polishing layer. The porous polishing layer has a dual-void structure in a polyurethane matrix. The dual-void structure is formed of primary and secondary sets of voids. The void wall of the first set of the void has the thickness of 15~55 micron meters and storage modulus of 10~60 MPa. The second set of the void has the average size of 5~30 micron meters of void. The porous polishing layer is fixed to a polymeric film or a sheet substrate or is formed in woven or non-woven structure.
申请公布号 KR20110034561(A) 申请公布日期 2011.04.05
申请号 KR20100093320 申请日期 2010.09.27
申请人 ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. 发明人 JAMES DAVID B.;SANFORD CRANE HENRY
分类号 B24D3/32;B24B37/00;B24D11/00;C09K3/14 主分类号 B24D3/32
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