发明名称 |
DUAL-PORE STRUCTURE POLISHING PAD |
摘要 |
PURPOSE: A polishing pad of a dual-void structure is provided to reduce defects caused by pads and increase polishing speed. CONSTITUTION: A polishing pad of a dual-void structure comprises a porous polishing layer. The porous polishing layer has a dual-void structure in a polyurethane matrix. The dual-void structure is formed of primary and secondary sets of voids. The void wall of the first set of the void has the thickness of 15~55 micron meters and storage modulus of 10~60 MPa. The second set of the void has the average size of 5~30 micron meters of void. The porous polishing layer is fixed to a polymeric film or a sheet substrate or is formed in woven or non-woven structure. |
申请公布号 |
KR20110034561(A) |
申请公布日期 |
2011.04.05 |
申请号 |
KR20100093320 |
申请日期 |
2010.09.27 |
申请人 |
ROHM AND HAAS ELECTRONIC MATERIALS CMP HOLDINGS, INC. |
发明人 |
JAMES DAVID B.;SANFORD CRANE HENRY |
分类号 |
B24D3/32;B24B37/00;B24D11/00;C09K3/14 |
主分类号 |
B24D3/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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