发明名称 PARTICLE BEAM MASS SPECTROSCOPY
摘要 PURPOSE: A particle beam mass spectroscopy is provided to improve the productivity and yield by monitoring the nano particles. CONSTITUTION: An aerodynamic lens(10) forms a particle beam by accelerating the gas flow. An electron gun(30) forms charged particle beam by ionizing the particle beam and accelerating thermoelectron. A deflector(40) refracts the charged particle beam by the kinetic energy to charge ratio. A sensor(50) measures current by the charged particle beam. A magnetic field generating unit creates restriction magnet field for restricting thermoelectron.
申请公布号 KR20110034430(A) 申请公布日期 2011.04.05
申请号 KR20090091953 申请日期 2009.09.28
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 KANG, SANG WOO;YUN, JU YOUNG;SHIN, YONG HYEON;KIM, TAE SUNG;YOON, JIN UK
分类号 H01J49/26;G01N27/62 主分类号 H01J49/26
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