发明名称 SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device in which more fuse settings are switched by anti-fusing. <P>SOLUTION: The semiconductor device includes n-units of function decision circuits 41-1 to 41-n prepared corresponding to functional circuits having different functions or characteristics; a fuse circuit 31 and fuse circuit 32 each having n-pieces of fuse elements and storing function setting information used for decision of each of the function decision circuits; and an anti-fuse decision circuit 20 for selecting one of the fuse circuits according to a continuity/discontinuity state of an anti-fuse element AF1. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011066311(A) 申请公布日期 2011.03.31
申请号 JP20090217404 申请日期 2009.09.18
申请人 ELPIDA MEMORY INC 发明人 MOROHASHI SEI;MATSUMOTO YOSHINORI
分类号 H01L21/822;G01R31/28;H01L21/82;H01L27/04 主分类号 H01L21/822
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