发明名称 |
METHOD FOR FORMING COPPER LAYER ON SEMICONDUCTOR WAFER |
摘要 |
PROBLEM TO BE SOLVED: To provide an electroplating method capable of controlling a plating operations dynamically. SOLUTION: The electroplating method for forming a copper layer on a wafer 20 includes: a stage for placing the wafer 20 in an electroplating chamber 10, wherein the electroplating chamber (10) has a control system 34 that is electrically coupled to the wafer 20 through at least one electrical contact 18, and wherein the control system 34 provides power to the wafer 20; a stage for powering the wafer 20 to electroplate copper onto the wafer 20; and a stage for monitoring an electrical property of the wafer 20 during electroplating to determine when to change conditions in the electroplating chamber 10. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011063888(A) |
申请公布日期 |
2011.03.31 |
申请号 |
JP20100281417 |
申请日期 |
2010.12.17 |
申请人 |
FREESCALE SEMICONDUCTOR INC |
发明人 |
CINDY REIDSEMA SIMPSON;MIKKOLA ROBERT DOUGLAS;HERRICK MATTHEW T;BAKER BRETT CAROLINE;PENA DAVID MORALEZ;ACOUSTA EDWARD;CHOWDHURY RINA;AZRAK MARIJEAN;GOLDBERG CINDY KAY;ISLAM MOHAMMED RABIUL |
分类号 |
C25D5/18;C25D21/12;C25D7/12;C25D21/00;H01L21/28;H01L21/288;H01L21/3205;H01L21/768;H01L23/52 |
主分类号 |
C25D5/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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