| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a delay generator provided with a comparator that does not use differential pair transistors, and to provide a semiconductor test device provided with the delay generator. <P>SOLUTION: The delay generator including a delaying unit 111 having capacitance for making an input signal have a delay only by set time; a DA converter 110 for generating comparison reference voltage; and a comparator 1 for comparing output voltage output form the delaying unit with the comparison reference voltage, wherein the comparator 1 includes: an inverter circuit 2A for comparing a threshold based on the comparison reference voltage Vth with the output voltage to perform inversion; a first voltage source 5 for setting positive voltage Vd1 of the inverter circuit 2A; and a second voltage source 6 for setting negative voltage Vs1 of the inverter circuit 2A. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
