发明名称 |
CONNECTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND TEST HANDLER INCLUDING THE SAME |
摘要 |
PURPOSE: A connecting apparatus for testing a semiconductor device and a test handler including the same are provided to rapidly and accurately connect a semiconductor device to a test device. CONSTITUTION: In a connecting apparatus for testing a semiconductor device and a test handler including the same, a tray rail(110) moves test tray with making it opposite to a test device in a test chamber. A match tray(120) moves the semiconductor to the test tray with pushing it through a plurality of pushers. A guide bar(130) is mounted in the inner wall of the test chamber around match tray and the tray rail. A guide holder(140) combines the match plate and the guide bar to guide the match plate. |
申请公布号 |
KR20110033474(A) |
申请公布日期 |
2011.03.31 |
申请号 |
KR20090090991 |
申请日期 |
2009.09.25 |
申请人 |
SECRON CO., LTD. |
发明人 |
KWON, SE MIN;PARK, CHANG EOK |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|