发明名称 CONNECTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND TEST HANDLER INCLUDING THE SAME
摘要 PURPOSE: A connecting apparatus for testing a semiconductor device and a test handler including the same are provided to rapidly and accurately connect a semiconductor device to a test device. CONSTITUTION: In a connecting apparatus for testing a semiconductor device and a test handler including the same, a tray rail(110) moves test tray with making it opposite to a test device in a test chamber. A match tray(120) moves the semiconductor to the test tray with pushing it through a plurality of pushers. A guide bar(130) is mounted in the inner wall of the test chamber around match tray and the tray rail. A guide holder(140) combines the match plate and the guide bar to guide the match plate.
申请公布号 KR20110033474(A) 申请公布日期 2011.03.31
申请号 KR20090090991 申请日期 2009.09.25
申请人 SECRON CO., LTD. 发明人 KWON, SE MIN;PARK, CHANG EOK
分类号 G01R31/26;H01L21/66 主分类号 G01R31/26
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