发明名称 OXIDE SEMICONDUCTOR FILM AND SEMICONDUCTOR DEVICE
摘要 It is an object to provide a highly reliable semiconductor device with good electrical characteristics and a display device including the semiconductor device as a switching element. In a transistor including an oxide semiconductor layer, a needle crystal group provided on at least one surface side of the oxide semiconductor layer grows in a c-axis direction perpendicular to the surface and includes an a-b plane parallel to the surface, and a portion except for the needle crystal group is an amorphous region or a region in which amorphousness and microcrystals are mixed. Accordingly, a highly reliable semiconductor device with good electrical characteristics can be formed.
申请公布号 WO2011036999(A1) 申请公布日期 2011.03.31
申请号 WO2010JP65190 申请日期 2010.08.30
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD.;YAMAZAKI, SHUNPEI;SAKAKURA, MASAYUKI;WATANABE, RYOSUKE;SAKATA, JUNICHIRO;AKIMOTO, KENGO;MIYANAGA, AKIHARU;HIROHASHI, TAKUYA;KISHIDA, HIDEYUKI 发明人 YAMAZAKI, SHUNPEI;SAKAKURA, MASAYUKI;WATANABE, RYOSUKE;SAKATA, JUNICHIRO;AKIMOTO, KENGO;MIYANAGA, AKIHARU;HIROHASHI, TAKUYA;KISHIDA, HIDEYUKI
分类号 H01L29/786;H01L21/20;H01L21/336 主分类号 H01L29/786
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