发明名称 A METHOD TO MEASURE LOCAL IMAGE SIMILARITY BASED ON THE L1 DISTANCE MEASURE
摘要 PURPOSE: A local image similarity measurement method based on L1 interval scale is provided to be applied to image recovery applications such as a computer vision, machine learning, and super resolution, in-painting, texture synthesis, segment, and object/scene/texture categorization, and other embodies. CONSTITUTION: An imaging condition is obtained. Based on factors, a proper patch size is determined. From a LUT(Lookup Table), a corresponding threshold value is selected. Threshold value items in the LUT is based on branch elements including smooth conversion between desired similarity ratio, the imaging conditions and various patch size embodiments. A similarity of a local image is measured. A local image similarity standard can be used in applications including restoration, classification, segmentation and detection.
申请公布号 KR20110033801(A) 申请公布日期 2011.03.31
申请号 KR20100092876 申请日期 2010.09.24
申请人 SONY CORPORATION;SONY ELECTRONICS, INC. 发明人 BAQAI FARHAN A.;NISHIO KENICHI;DONG XIAOGANG;MATSUSHITA NOBUYUKI;MATSUI AKIRA;TAKATORI JIRO
分类号 G06T7/00;H04N5/225 主分类号 G06T7/00
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