发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor manufacturing method which can form a semiconductor wafer or a semiconductor device having a high reliability and good characteristics while suppressing autodoping of wafer impurity into an epitaxial layer without causing irregularity in characteristics. SOLUTION: The method includes: holding a wafer in a reaction chamber; controlling the inside of the reaction chamber under a predetermined pressure; rectifying and supplying a process gas onto the wafer from above, while heating and rotating the wafer; controlling an exhaust gas on the wafer containing a surplus process gas and a reaction by-product generated by the process gas so that a main stream speed of the gas on an edge of the wafer is 0.7 to 2.0 m/sec; and discharging the gas toward the outer periphery from above the wafer to form an epitaxial layer on the wafer. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011066225(A) |
申请公布日期 |
2011.03.31 |
申请号 |
JP20090215868 |
申请日期 |
2009.09.17 |
申请人 |
NUFLARE TECHNOLOGY INC |
发明人 |
ARAI KUNIAKI;TSUMORI TOSHIRO;MITANI SHINICHI;SUZUKI KUNIHIKO |
分类号 |
H01L21/205;C23C16/24;C23C16/455 |
主分类号 |
H01L21/205 |
代理机构 |
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地址 |
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