发明名称 METHOD FOR FORMING III-V SEMICONDUCTOR STRUCTURES INCLUDING ALUMINUM-SILICON NITRIDE PASSIVATION
摘要 A method for fabricating a semiconductor structure includes forming a semiconductor layer over a substrate and forming an aluminum-silicon nitride layer upon the semiconductor layer. When the semiconductor layer in particular comprises a III-V semiconductor material such as a group III nitride semiconductor material or a gallium nitride semiconductor material, the aluminum-silicon nitride material provides a superior passivation in comparison with a silicon nitride material.
申请公布号 WO2010151857(A3) 申请公布日期 2011.03.31
申请号 WO2010US40137 申请日期 2010.06.28
申请人 CORNELL UNIVERSITY;SHEALY, JAMES R.;BROWN, RICHARD 发明人 SHEALY, JAMES R.;BROWN, RICHARD
分类号 H01L21/31;H01L21/318;H01L21/336;H01L29/778 主分类号 H01L21/31
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