发明名称 THREE-DIMENSIONAL INFORMATION MEASURING DEVICE AND THREE-DIMENSIONAL INFORMATION MEASURING METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To measure three-dimensional information by pattern light projection even if an object to be measured is strong in surface reflection due to the application or the like of a glossiness coating such as metal and ceramics, and an automobile and its part. <P>SOLUTION: A three-dimensional information measuring device includes: a pattern light projection device 1 projected not to directly hit pattern light on the object to be measured; a reflection plate 2 for reflecting pattern light projected by the pattern light projection device 1 to be projected on the object A to be measured; a camera device 3 for imaging the object A to be measured projecting the pattern light reflected on the reflection plate 2 to acquire a projected pattern image and a camera device 3 not having the same direction as a projection direction of the pattern light reflecting an optical path of a lens on the reflection plate 2; and a data processing device 4 for calculating the three-dimensional information of the object A to be measured from projected pattern images. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011064617(A) 申请公布日期 2011.03.31
申请号 JP20090216505 申请日期 2009.09.18
申请人 FUKUOKA INSTITUTE OF TECHNOLOGY;3D IMAGE KENKYUSHO:KK 发明人 RO SONI
分类号 G01B11/25 主分类号 G01B11/25
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