| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device having a test operation mode for determining a logic level of a plurality of internal signals by a current measurement result. SOLUTION: A test circuit 100 includes current sources 11-14, a reference current source 21, an input initial stage circuit 31, an OR circuit 35, selector circuits 41-44 and a terminal capacity countermeasure transistor (N-channel type MOS transistor Mn31). The current sources 11-14 constitute a current control circuit, and sends to the ground, a current corresponding to the size of a constituted transistors connected in series from an external terminal INP through the terminal capacity countermeasure transistor (N-channel type MOS transistor Mn31) in a test operation mode. COPYRIGHT: (C)2011,JPO&INPIT
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