发明名称 APPARATUS AND METHOD FOR MEASURING LOCATION AND SYSTEM FOR MEASURING LOCATION USING THE SAME
摘要 PURPOSE: An apparatus and method for measuring location and a system for measuring location using the same are provided to improve the accuracy in location measurement by selecting triangular points having accurate measurement distances with a measurement target terminal from plural triangular points. CONSTITUTION: A data communication unit(110) receives the distance information between plural triangular points and a measurement target terminal, and a unique identification number. An overlapping pattern forming unit(120) forms the overlapping pattern for the triangular point combination of the plural triangular points. A triangular point selection unit(140) selects top three triangular points having the highest final score. A location measurement unit(150) measures the coordinate of the selected three triangular points and the location of the measurement target terminal based on the distance information.
申请公布号 KR20110032032(A) 申请公布日期 2011.03.30
申请号 KR20090089333 申请日期 2009.09.22
申请人 SAMSUNG S.D.S CO., LTD. 发明人 SONG, SEONG DAE;KIM, TAE WOONG;JANG, HYUN TAE;KIM, SEUNG KUK
分类号 H04W64/00;G01S5/02 主分类号 H04W64/00
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