| 摘要 |
PURPOSE: A probe unit including one wafer is provided to improve the efficiency of the LCD characteristic inspection. CONSTITUTION: An upper blade(100) is inserted into the upper side of a wafer(300). A lower blade(200) is inserted into the lower surface of the wafer. A top blade fixing key(400) is attached to the upper side of the wafer. A bottom blade fixing key(500) is attached to the lower surface of the wafer. |
