发明名称 Defect resolution methodology and target assessment process with a software system
摘要 Embodiments of the invention are generally related to computer systems, and more specifically to the analysis of defects in computer software products. Defects uncovered during software testing may be stored in a data structure as data defects, code defects, or environment defects, along with further data describing a particular nature of the defects. The defects may be analyzed to determine a particular problem area causing the defects. If a particular class of defects is determined to be the dominant class of defects encountered during testing, an analysis path of that class of defects may be followed to determine a cause for the defects in the respective class. Therefore, corrective measures tailored to resolving the defects associated with the determined cause may be taken.
申请公布号 US7917897(B2) 申请公布日期 2011.03.29
申请号 US20070675920 申请日期 2007.02.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BASSIN KATHRYN ALLYN;LEPEL BRIAN RICHARD;LESLIE WARREN JAMES;SKRABANEK SUSAN EILEEN;SPRINGER CRYSTAL FAYE;STEFFENHAGEN NATHAN GARY
分类号 G06F9/44;G06F9/45 主分类号 G06F9/44
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