发明名称 Method of evaluating the quality of a lapping plate
摘要 Embodiments of the present invention pertain to a evaluating the quality of a lapping plate. In one embodiment, information that indicates the quality of a lapping plate is received while the lapping plate is being used to lap a slider, and the information is used to evaluate the quality of the lapping plate while the lapping plate is being used to lap the slider.
申请公布号 US7914362(B2) 申请公布日期 2011.03.29
申请号 US20050289930 申请日期 2005.11.30
申请人 HITACHI GLOBAL STORAGE TECHNOLOGIES, NETHERLANDS B.V. 发明人 BUNCH RICHARD DALE;CRAWFORTH LINDEN JAMES;PADILLA EDUARDO;WU XIAO Z.
分类号 B24B51/00;B24B37/00;B24B49/00 主分类号 B24B51/00
代理机构 代理人
主权项
地址