发明名称 |
Method of evaluating the quality of a lapping plate |
摘要 |
Embodiments of the present invention pertain to a evaluating the quality of a lapping plate. In one embodiment, information that indicates the quality of a lapping plate is received while the lapping plate is being used to lap a slider, and the information is used to evaluate the quality of the lapping plate while the lapping plate is being used to lap the slider.
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申请公布号 |
US7914362(B2) |
申请公布日期 |
2011.03.29 |
申请号 |
US20050289930 |
申请日期 |
2005.11.30 |
申请人 |
HITACHI GLOBAL STORAGE TECHNOLOGIES, NETHERLANDS B.V. |
发明人 |
BUNCH RICHARD DALE;CRAWFORTH LINDEN JAMES;PADILLA EDUARDO;WU XIAO Z. |
分类号 |
B24B51/00;B24B37/00;B24B49/00 |
主分类号 |
B24B51/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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