发明名称 Arc detector for plasma processing system
摘要 An arc detector is provided for a plasma processing system including a HF power source, a plasma processor, and a voltage/current signal detector. The arc detector includes a calculator for the phase difference between the AC voltage signal and the AC current signal, a calculator for an effective voltage based on the AC voltage signal, a calculator for an effective current based on the AC current signal, an FFT processor for the frequency spectrum of the AC voltage or current signal, and an arc analyzer connected to the phase difference calculator, effective voltage calculator, effective current calculator, and FFT processor. The arc analyzer calculates the plasma processor's impedance based on the calculated phase difference, effective voltage, and effective current. The arc analyzer monitors arcs in the plasma processor, based on the fluctuation rate of the calculated impedance and the output level of a frequency component in the spectrum.
申请公布号 US7915563(B2) 申请公布日期 2011.03.29
申请号 US20070906120 申请日期 2007.09.28
申请人 DAIHEN CORPORATION 发明人 TANAKA RYOHEI
分类号 B23K10/00;H05H1/00;H05H1/46 主分类号 B23K10/00
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