发明名称 JTAG test architecture for multi-chip pack
摘要 A test-communication path is provided between chips in a multi-chip package. Externally-accessible JTAG input and output pins are provided to a first chip in the multi-chip package, and this first chip is configured to allow signals received on these JTAG pins to be routed to other chips in the multi-chip package. Control signals provided to the first chip control the routing of the JTAG signals to each chip.
申请公布号 US7917819(B2) 申请公布日期 2011.03.29
申请号 US20050585607 申请日期 2005.01.05
申请人 NXP B.V. 发明人 TALAYSSAT JACKY;BUWALDA SAKE
分类号 G01R31/28;G01R31/3185 主分类号 G01R31/28
代理机构 代理人
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