发明名称 INSPECTION DEVICE AND QUALITY DISCRIMINATION DEVICE
摘要 PROBLEM TO BE SOLVED: To constitute a quality discrimination device can execute double check or more check surely to an inspection object. SOLUTION: Inspection devices 4, 5 execute respectively a measurement processing for measuring the same capacitance value C to the same capacitor 2, and an inspection processing for inspecting the quality of the capacitor 2 by comparing the measured capacitance value C with a common reference value Cr for discrimination set beforehand, and constitutes the quality discrimination device 1 together with a processing device 6 for executing a quality determination processing for determining the final quality of the capacitor 2 based on an inspection result Dd in the inspection processing by the inspection devices 4, 5. The inspection device 4 executes a comparison processing for comparing own reference value Cr4 for discrimination with a reference value Cr5 for discrimination set in the other inspection device 5, and outputting the comparison result. The inspection device 5 executes a comparison processing for comparing own reference value Cr5 for discrimination with the reference value Cr4 for discrimination set in the inspection device 4, and outputting the comparison result. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011059049(A) 申请公布日期 2011.03.24
申请号 JP20090211591 申请日期 2009.09.14
申请人 HIOKI EE CORP 发明人 TERAJIMA TAKAYUKI;USUI TAKAYUKI;SATO TATSUYA;KOYAMA ATSUSHI
分类号 G01R31/00 主分类号 G01R31/00
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