发明名称 AUTOMATIC ANALYSIS DEVICE, AND ALLOCATION METHOD OF INSPECTION THEREFOR
摘要 PROBLEM TO BE SOLVED: To heighten a throughput of inspection by allocating each inspection to a pretreatment cell, or by arranging it according to each pretreatment kind so that a specimen pretreated without rest to the utmost can be dispensed into an inspection device 1009, in an automatic analysis device having a plurality of pretreatment disks 1006, 1007 for pretreating the specimen 1003, and the inspection device 1009 for dispensing the pretreated specimen and inspecting it. SOLUTION: When integrating inspections of the same specimen classified by the same pretreatment kind, and allocating a plurality of inspections into a plurality of pretreatment cells, inspections having a cycle number or more related to pretreatment are allocated to each pretreatment cell, and inspections are allocated to the last pretreatment cell, which has a larger number than the number of inspections allocated to the last pretreatment cell when allocating successively from the front the maximum allocatable inspection number. Further, each throughput is calculated with respect to each rearrangement classified by each pretreatment kind by using the number of inspections allocated to the last pretreatment cell, and a rearrangement having a large throughput is selected from among them. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011058975(A) 申请公布日期 2011.03.24
申请号 JP20090209629 申请日期 2009.09.10
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 KOGA AKIHIKO;CHIKAHISA MASAAKI;HONDA JOJI;KANBARA KATSUHIRO;ORIHASHI TOSHIHIDE;KOMATSU HIDENOBU;SAITO YOSHIAKI
分类号 G01N35/02;G01N35/04 主分类号 G01N35/02
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