| 摘要 |
PROBLEM TO BE SOLVED: To provide an image inspection method for precisely and efficiently inspecting the quality of an image to be inspected, and an image inspection device. SOLUTION: When the MAHALANOBIS distance at each divided image to be inspected wherein an image to be inspected is divided is larger than the second reference value of a reference space (S46:YES), the image to be inspected is determined to be bad (S54) and, if the MAHALANOBIS distance is smaller than a first reference value (S47:NO), the image to be inspected is determined to be good (S53). When the MAHALANOBIS distance of the signal space is smaller than the second reference value but larger than the first reference value (S47:YES), the divided image to be inspected is provisionally determined to be bad to further divide the divided images to be inspected to again form the signal space to thereby again perform quality determination (S49-S52). Then, when the divided image to be inspected is newly provisionally determined to be bad, the processings S48-S52 are repeatedly executed until the divided image to be inspected is determined to be good or bad. COPYRIGHT: (C)2011,JPO&INPIT |
