| 摘要 |
<p>A probe circuit is provided in the same electronic device as a tested circuit that outputs a response signal, which is responsive to an input signal, in synchronism with an operation clock. The probe circuit comprises: a sampling clock providing unit for outputting sampling clocks at a predetermined frequency; and a sampling unit for outputting, to the exterior to the electronic device, a probe output signal that is in accordance with a result from sampling the response signal by use of the sampling clocks and that has a lower frequency than the response signal. The response signal is output in such a manner that a predetermined signal pattern is repeated in each of a plurality of predetermined repetition periods. The sampling clock providing unit outputs, in each repetition period, the sampling clocks the phases of which sequentially change relative to the phase of the signal pattern.</p> |
