发明名称 SEMICONDUCTOR CIRCUIT AND LSI TEST METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor circuit capable of obtaining a drive voltage according to an operating mode without using a regulator; and to provide an LSI test method using the semiconductor circuit. <P>SOLUTION: The semiconductor circuit includes an enable control circuit for separately controlling an enable of a plurality of power switches arranged for each power source domain. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011060976(A) 申请公布日期 2011.03.24
申请号 JP20090208623 申请日期 2009.09.09
申请人 RICOH CO LTD 发明人 INADA YOICHI
分类号 H01L21/822;G01R31/28;G06F1/26;H01L27/04 主分类号 H01L21/822
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