发明名称 SUBSTRATE PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a substrate processing apparatus including a substrate conveyance function correcting positional displacement of a wafer in an FOUP (Front Opening Unified Pod) loaded in a semiconductor manufacturing apparatus only by altering a conveyance method without providing an expensive device mechanism. SOLUTION: The substrate processing apparatus includes: a processing chamber processing a substrate; a vacuum conveyance chamber including a first conveyance means conveying the substrate from a preliminary chamber to the processing chamber; an atmospheric conveyance chamber including a second conveyance means conveying the substrate from a carrier to the preliminary chamber; and a control means for controlling the first conveyance means and the second conveyance means. When the substrate in the carrier is taken out, the control means controls the second conveyance means to take out the substrate after positioning the substrate. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011061135(A) 申请公布日期 2011.03.24
申请号 JP20090211654 申请日期 2009.09.14
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 OKUNO MASANORI;FUKUDA MITSURU;MIZUGUCHI YASUHIRO
分类号 H01L21/677;H01L21/68 主分类号 H01L21/677
代理机构 代理人
主权项
地址