发明名称 TEST AND MEASUREMENT INSTRUMENT
摘要 PROBLEM TO BE SOLVED: To detect a post-acquisition trigger event, to adjust a position of at least one waveform, and to make it the position adjustment adapted to a time point of the post-acquisition trigger event. SOLUTION: An analog-digital converter 108 receives a signal under a test of an input terminal 110 and generates a digital sample. An acquisition memory 115 stores the digital sample of the signal under test as a data record 117. A display device 135 is associated with the signal under the test. A first trigger circuit 120 detects a live event in the signal under the test based on a first trigger criterion and automatically adjusts the waveform so that the waveform is adapted to the time point of the live trigger event. A second trigger circuit 125 detects one or more post-acquisition trigger events in the data record based on a second trigger criterion. A display device is configured to adjust a display of the one or more post-acquisition trigger events and a waveform associated with the data record according to one or more configurable trigger control. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011059107(A) 申请公布日期 2011.03.24
申请号 JP20100189973 申请日期 2010.08.26
申请人 TEKTRONIX INC 发明人 BARTLETT JOSIAH A;VEITH KRISTIE L;SULLIVAN STEVEN K
分类号 G01R13/20 主分类号 G01R13/20
代理机构 代理人
主权项
地址