| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To inspect how much luminance is lowered according to conditions of a pulse laser beam in the case of diving a sapphire by the formation of a modified layer by irradiation with the pulse laser beam. <P>SOLUTION: In a sapphire substrate, modified layers are formed on two first division-planned lines by pulse laser beams of a first condition and a second condition, and modified layers are formed on two second division-planned lines by a pulse laser beam of the first condition and the second condition to obtain a first light-emitting device cut out only each by the first condition and a second light-emitting device cut out only by the second condition. Each luminance of the first and second light-emitting devices is measured to determine a difference with pre-division luminance measured on each light-emitting device prior to the division of the sapphire substrate on each device and inspect the difference in luminance reduction caused by the difference of the conditions. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
