发明名称 RESISTANCE CHANGE MEMORY AND CONTROL METHOD THEREOF
摘要 According to one embodiment, a resistance change memory includes a memory cell array in which a plurality of blocks are provided, resistance change storage elements which are provided in blocks and which store data in accordance with a change in resistance state, first and second wirings in the blocks, each of the first and second wirings being connected to each of resistance change storage elements, and a control circuit which controls the state of a selected block targeted for operation and the state of unselected blocks except the selected block among the blocks. The control circuit respectively applies first and second unselect potentials to the first and second wirings in at least one of the unselected blocks during a period in which the selected block is in operation.
申请公布号 US2011069533(A1) 申请公布日期 2011.03.24
申请号 US20100880642 申请日期 2010.09.13
申请人 KUROSAWA TOMONORI;MAEJIMA HIROSHI 发明人 KUROSAWA TOMONORI;MAEJIMA HIROSHI
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
主权项
地址