ELECTRONIC DEVICE AND METHOD FOR TESTING SERIAL SIGNALS

摘要

An electronic device includes a serial signal test system to test serial signals generated by a serial signal generator. A test method tests serial signals using the electronic device. The test method sets test parameters that tests serial signals. Furthermore, the test method identifies an error bit from coded bits of each of the serial signals, and identifies abnormal attribute data of each of the serial signals. In addition, the test method generates a test report according to all identified error bits and abnormal attribute data.