METHOD FOR MEASURING THE ALIGNMENT OF A ELECTRONIC DEVICE AND APPARATUS FOR MEASURING USING THE SAME

摘要

PURPOSE: A method and a device for measuring the alignment of an electronic device are provided to automate an alignment measurement process by automating a scan process and data comparison process. CONSTITUTION: Arrangement data is provided based on the arrangement of an electronic device(S110). Image data is generated by scanning a substrate including the electronic device(S120). The alignment of the electronic device is measured by comparing the arrangement data with the image data(S130). The electronic device is mounted on a cavity formed on an embedded substrate. In an alignment measuring process, the arrangement data is matched with the image data and the position difference of the electronic device is measured from the matched arranged data and image data.