| 摘要 |
A semiconductor integrated circuit, including a data input unit for receiving an input data signal to be supplied to an external data input terminal, a storage unit for storing the input data signal received by the data input unit, a timing generating unit for generating a timing signal in response to an output request signal, a data output unit for outputting, in synchronization with the timing signal, the input data signal stored in the storage unit as an output data signal, a test output control unit for outputting, in synchronization with the timing signal, and a data selector for outputting the output data signal supplied from the data output unit to the external data output terminal in a normal operation mode and outputting the input data signal supplied from the test output control unit to the external data output terminal in a test mode.
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