| 摘要 |
A method for designing artificial impedance surfaces is disclosed. The method involves matching impedance component values required for a given far-field radiation pattern (determined, for example, by holographic means) with measured or simulated impedance component values for the units of a lattice of conductive structures used to create an artificial impedance surface, where the units of the lattice have varied geometry. For example, a unit could be a square conductive structure with a slice (removed or missing material) through it. The measured or simulated impedance components are determined by measuring wavevector values for test surfaces in three or more directions over any number of test surfaces, where each unit of a given test surface has the same geometric shape and proportions as all of the other units of that test surface, but each test surface has some form of variation in the unit geometry from the other test surfaces. These test measurements create a table of geometry vs. impedance components that are used to design the artificial impedance structure. Since polarization can be controlled, the structure can be an artificial impedance surface characterized by a tensor impedance having complex components. |
