发明名称 Semiconductor integrated circuit and method for testing semiconductor integrated circuit
摘要 A check computation circuit executes a computation corresponding to a computation for generating confidential CRC data, with respect to confidential data read from a non-volatile device. A comparison circuit compares the result of the computation in the check computation circuit with confidential CRC data read from the non-volatile device. When the result of the comparison indicates a mismatch, i.e., an error is detected, an encryption circuit encrypts the confidential data and the confidential CRC data using a secret key registered in a secret key register, and outputs the encrypted confidential data and confidential CRC data to the outside of a semiconductor integrated circuit.
申请公布号 US7913316(B2) 申请公布日期 2011.03.22
申请号 US20070703719 申请日期 2007.02.08
申请人 PANASONIC CORPORATION 发明人 TORISAKI YUISHI;FUJIWARA MAKOTO;NEMOTO YUSUKE
分类号 G06F11/00 主分类号 G06F11/00
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