发明名称 Self-refresh period measurement circuit of semiconductor device
摘要 A self-refresh period measurement circuit of a semiconductor device is disclosed, herein which includes a period measurement start signal generator configured to receive a self-refresh signal and an oscillation signal, to allow a self-refresh operation to be performed, and generate a period measurement start signal, to set the time that the oscillation signal is enabled, and a refresh period output unit configured to receive the period measurement start signal and the oscillation signal, and generate a refresh period output signal that is enabled for a period from the time that the period measurement start signal is enabled to a time that the oscillation signal is enabled.
申请公布号 US7911868(B2) 申请公布日期 2011.03.22
申请号 US20090319877 申请日期 2009.01.13
申请人 HYNIX SEMICONDUCTOR INC. 发明人 LEE KYONG HA
分类号 G11C7/00 主分类号 G11C7/00
代理机构 代理人
主权项
地址