发明名称 LIGHT EMITTING DIODE REPAIR METHOD AND APPARATUS USING QUANTUM DOT COATING
摘要 PURPOSE: A method and a device for repairing a light emitting diode using quantum dot coating are provided to measure a light emitting property value to form a quantum dot on a light emitting diode defined as a defective product, thereby repairing the light emitting diode. CONSTITUTION: A light emitting property value of a light emitting diode is measured. The light emitting property value comprises a digital value for a color or luminance. A light emitting diode whose measured light emitting property value is out of a target range is defined as a defective product. A quantum dot layer is formed on the top layer of the defective light emitting diode. The defective light emitting diode is transferred to a lower part of a quantum point mask.
申请公布号 KR20110028737(A) 申请公布日期 2011.03.22
申请号 KR20090086310 申请日期 2009.09.14
申请人 TOP ENGINEERING CO., LTD. 发明人 KIM, WON NAM
分类号 H01L33/02;H01L21/66 主分类号 H01L33/02
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