发明名称 Semiconductor memory and fabrication method for the same
摘要 A semiconductor memory includes memory cell transistors including a tunnel insulating film, a floating gate electrode, a first insulating film, a control gate electrode, and a first metal salicide film; low-voltage transistors having a first p-type source region and a first p-type drain region, a first gate insulating film, and a first gate electrode of an n conductivity type having the same dose of a first p-type impurity as with the first p-type source region; and high-voltage transistors having a second p-type source region and a second p-type drain region, a second gate insulating film thicker than the first gate insulating film, and a second gate electrode of an n conductivity type having the same dose of a second p-type impurity as with the second p-type source region.
申请公布号 US7910424(B2) 申请公布日期 2011.03.22
申请号 US20080277831 申请日期 2008.11.25
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ENDO MASATO
分类号 H01L21/8238 主分类号 H01L21/8238
代理机构 代理人
主权项
地址