| 摘要 |
PROBLEM TO BE SOLVED: To provide a test apparatus, a test method, a program, and an interface circuit which can perform an open test by a simpler construction. SOLUTION: The test apparatus for testing a device under test includes: a power supply part for supplying power supply voltage to a power input terminal of the device under test; a signal supply part for supplying a test signal to a signal terminal of the device under test; a detection part for, when the power voltage which is lower than the voltage supplied to the signal terminal is supplied to the power input terminal, detecting a current passing from the signal supply part to the power input terminal through a protective diode within the device under test for passing overvoltage input to the signal terminal to the power input terminal; and an open determination part for determining that the midway between the signal supply part and the signal terminal is not open when a current passing from the signal terminal to the power input terminal is detected. COPYRIGHT: (C)2011,JPO&INPIT
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