发明名称 SEMICONDUCTOR DEVICE STRUCTURE WITH STRAIN LAYER AND METHOD OF FABRICATING THE SEMICONDUCTOR DEVICE STRUCTURE
摘要 A semiconductor device with a strain layer and a method of fabricating the semiconductor device with a strain layer that can reduce a loading effect are provided. By arranging active dummies and gate dummies not to overlap each other, the area of active dummy on which a strain layer dummy will be formed can be secured, thereby reducing the loading effect.
申请公布号 US2011062497(A1) 申请公布日期 2011.03.17
申请号 US20100951808 申请日期 2010.11.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SEUNG-HWAN;SHIN HEON-JONG;MAEDA SHIGENOBU;WI SUNG-REY;WANGXIAO QUAN;CHOI HYUN-MIN
分类号 H01L29/78 主分类号 H01L29/78
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