发明名称 NONVOLATILE SEMICONDUCTOR MEMORY AND METHOD OF TESTING THE SAME
摘要 A memory cell array and a peripheral circuit are provided. The memory cell array has a plurality of blocks which are erasing units respectively. Each of the blocks includes a plurality of memory cells. A block control unit operates according to input signals from outside and controls operation of the blocks. A ready/busy control circuit outputs a busy signal during a period of operation implementation for a block selected from the blocks, in response to an output from the block control unit. The ready/busy control circuit outputs a ready signal out of the period of the operation implementation for the selected block. A registration control unit registers the selected block as a bad block, in the case that the ready/busy control circuit outputs a busy signal when the registration control unit receives a bad block identification command.
申请公布号 US2011063909(A1) 申请公布日期 2011.03.17
申请号 US20100713674 申请日期 2010.02.26
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KOMATSU YUKIO
分类号 G11C16/06;G11C16/04;G11C29/00 主分类号 G11C16/06
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