发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To separate a reaction product produced in etching quickly from an etched layer to suppress nonuniformity of etching rates on an etched surface. SOLUTION: The etched layer is formed on a substrate 300. A mask pattern is then formed on that etched layer, which is then wet etched using the mask pattern as a mask. In this wet etching, the substrate 300 with the mask pattern directed downward is submerged in an etching bath 100. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011054731(A) 申请公布日期 2011.03.17
申请号 JP20090201882 申请日期 2009.09.01
申请人 RENESAS ELECTRONICS CORP 发明人 MURABE YUSAKU;BETSUMIYA FUMIHIRO
分类号 H01L21/306;H01L21/308;H01L21/60 主分类号 H01L21/306
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