发明名称 HIGH RESISTIVITY SILICON WAFER AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To allow a region where p/n-type inversion is caused to be formed in a depth range deeper than before. SOLUTION: A silicon wafer is a p-type wafer, which is doped with nitrogen, and has a p-type surface region of 0.1 to 10 kΩcm in resistance distribution in a depth direction from a surface, a peak region increasing and decreasing in resistance value in the depth direction to have a peak, and a p/n-type inversion depth region by an oxygen donor through a heat treatment of 1100 to 1250°C in processing temperature and 1 to 5 hours in processing time in an atmosphere of an argon gas, a hydrogen gas, or a mixed gas thereof, the peak position in the peak region being within a depth range of 10 to 70μm from the wafer surface. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011054656(A) 申请公布日期 2011.03.17
申请号 JP20090200420 申请日期 2009.08.31
申请人 SUMCO CORP 发明人 KURITA KAZUNARI
分类号 H01L21/322;C30B15/04;C30B29/06;C30B33/00;H01L21/324 主分类号 H01L21/322
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