发明名称 Method for manufacturing semiconductor device and bonding apparatus
摘要 A bonding apparatus includes: a storage unit that stores bonding conditions of a ball; a detection unit that detects a first position on a Z axis of a capillary with the ball coming into contact with a semiconductor element and detects a second position on the Z axis of the capillary when the ball at the tip end of the capillary is bonded to the semiconductor element; a calculation unit that calculates a collapse amount of the ball which is a difference between the first position and the second position detected by the detection unit and a bonding time and calculates a collapse amount of the ball for a predetermined period; and a first adjustment unit that adjusts the bonding conditions when the collapse amount of the ball for a predetermined period is outside a predetermined numerical range.
申请公布号 US2011062216(A1) 申请公布日期 2011.03.17
申请号 US20100923311 申请日期 2010.09.14
申请人 RENESAS ELECTRONICS CORPORATION 发明人 SANO TSUTOMU
分类号 B23K20/10;B23K20/00 主分类号 B23K20/10
代理机构 代理人
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