发明名称 METHOD AND APPARATUS FOR MEASURING SURFACE PROPERTIES
摘要 A method for measuring surface properties according to the present invention includes the steps of: with distance control feedback applied so that a desired physical quantity to be measured that is attributed to an interaction between a probe and a sample is actually measured while changing a measured distance between the probe and the sample in accordance with a relationship between the desired physical quantity and the measured distance, (i) setting a set value, corresponding to the desired physical quantity, which serves to change the measured distance; and (ii) recording, for each set value thus set, a relationship between the measured distance changed by the set value set in the step (i) and a physical quantity measured with the probe and the sample placed at that measured distance. This allows precise and quick measurement of a physical quantity even in a region where the probe and the sample are very close to each other, while avoiding a collision between them.
申请公布号 US2011062964(A1) 申请公布日期 2011.03.17
申请号 US20090991309 申请日期 2009.04.30
申请人 发明人 HOSOKAWA YOSHIHIRO;KOBAYASHI KEI;YAMADA HIROFUMI;MATSUSHIGE KAZUMI;MORI YUKIKO
分类号 G01R27/32;G01Q10/06 主分类号 G01R27/32
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