| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To overcome the problem in measurement by a terahertz time domain spectroscopic apparatus, which requires a certain amount of time to take measurements, therefore makes it hard to calculate a standard deviation of measured values by a statistical method by taking measurements many times, presents only measurement results in most cases without the standard deviation (random error) being derived from a spectrum of an optical constant or the like measured by the terahertz time domain spectroscopic apparatus, and has no way of evaluating its accuracy. <P>SOLUTION: Based on the findings that there is a good positive correlation between an intensity spectrum of terahertz wave electric fields measured by the terahertz time domain spectroscopic apparatus and its standard deviation spectrum, a method for calculating a standard deviation of one sample from an intensity spectrum of that sample by using a model of a standard deviation spectrum of intensity obtained from two or more reference intensities and their standard deviation spectra is provided, thereby constituting a method that makes it possible to estimate a standard deviation spectrum of an optical constant such as a transmittance or an absorption coefficient by measuring a sample only once. <P>COPYRIGHT: (C)2011,JPO&INPIT</p> |
